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| (300) EIT: Extreme-Ultraviolet Imaging Telescope for the SOHO Mission
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| (298) Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
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| (297) Irradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter
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- SIDCimport-575
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