Ref: SIDCimport-403

Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam

Malinowski, P. ; John, J ; Barkusky, F ; Duboz, J.-Y. ; Lorenz, A. ; Cheng, K. ; Derluyn, Joff ; Germain, M. ; de Moor, Piet ; Minoglou, Kyriaki ; Bayer, A. ; Mann, K. ; Hochedez, J.-F. ; Giordanengo, B. ; Borghs, G. ; Mertens, R.

published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009)

Note: Damage to VUV, EUV, and X-Ray Optics II. Edited by Juha, Libor; Bajt, Saša; Sobierajski, Ryszard.
Links: link; link2

The record appears in these collections:
Royal Observatory of Belgium > Solar Physics & Space Weather (SIDC)
Science Articles > Non-refereed Articles
Solar-Terrestrial Centre of Excellence

 Record created 2016-02-22, last modified 2016-02-22