Malinowski, P. ; John, J ; Barkusky, F ; Duboz, J.-Y. ; Lorenz, A. ; Cheng, K. ; Derluyn, Joff ; Germain, M. ; de Moor, Piet ; Minoglou, Kyriaki ; Bayer, A. ; Mann, K. ; Hochedez, J.-F. ; Giordanengo, B. ; Borghs, G. ; Mertens, R.

published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009)


Note: Damage to VUV, EUV, and X-Ray Optics II. Edited by Juha, Libor; Bajt, Saša; Sobierajski, Ryszard.
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