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000000360 037__ $$aSIDCimport-403
000000360 100__ $$aMalinowski, P.
000000360 245__ $$aRadiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
000000360 260__ $$c2009
000000360 500__ $$aDamage to VUV, EUV, and X-Ray Optics II. Edited by Juha, Libor; Bajt, Saša; Sobierajski, Ryszard. 
000000360 594__ $$aSTCE
000000360 700__ $$aJohn, J
000000360 700__ $$aBarkusky, F
000000360 700__ $$aDuboz, J.-Y.
000000360 700__ $$aLorenz, A.
000000360 700__ $$aCheng, K.
000000360 700__ $$aDerluyn, Joff
000000360 700__ $$aGermain, M.
000000360 700__ $$ade Moor, Piet
000000360 700__ $$aMinoglou, Kyriaki
000000360 700__ $$aBayer, A.
000000360 700__ $$aMann, K.
000000360 700__ $$aHochedez, J.-F.
000000360 700__ $$aGiordanengo, B.
000000360 700__ $$aBorghs, G.
000000360 700__ $$aMertens, R.
000000360 773__ $$c73610T-73610T-8$$pProceedings of SPIE$$v7361$$y2009
000000360 85642 $$ahttp://adsabs.harvard.edu/abs/2009SPIE.7361E..22M
000000360 85642 $$ahttp://cat.inist.fr/?aModele=afficheN=22128964
000000360 905__ $$apublished in
000000360 980__ $$aNONREF