@article{Malinowski:360,
      author        = "Malinowski, P. and John, J and Barkusky, F and Duboz,
                       J.-Y. and Lorenz, A. and Cheng, K. and Derluyn, Joff and
                       Germain, M. and de Moor, Piet and Minoglou, Kyriaki and
                       Bayer, A. and Mann, K. and Hochedez, J.-F. and Giordanengo,
                       B. and Borghs, G. and Mertens, R.",
      title         = "{Radiation hardness of AlxGa1-xN photodetectors exposed to
                       Extreme UltraViolet (EUV) light beam}",
      year          = "2009",
      note          = "Damage to VUV, EUV, and X-Ray Optics II. Edited by Juha,
                       Libor; Bajt, Saša; Sobierajski, Ryszard. ",
}