|
1.
| Science Article Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
/ Malinowski, P. ; John, J ; Barkusky, F ; Duboz, J.-Y. ; et al
published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009)
[SIDCimport-403]
|
|
2.
| Science Article (Ref.) Backside-Illuminated GaN-on-Si Schottky Photodiodes for UV Radiation Detection
/ Malinowski, P. ; John, J ; Duboz, J.-Y. ; Hellings, G. ; et al
published in IEEE Electron Device Letters, 30, pp. 1308-1310 (2009)
[SIDCimport-401]
|
|
3.
| Science Article AlGaN photo-detectors for applications in the extreme ultraviolet (EUV) wavelength range
/ Malinowski, P. ; John, J ; Lorenz, A. ; Aparicio, P. ; et al
published in SPIE, 7003, pp. 70030N (2008)
[SIDCimport-338]
|
|
4.
| Science Article AlGaN Extreme UV detectors for space applications
/ John, J ; Malinowski, P. ; Aparicio, P. ; Hellings, G. ; et al
published in WOCSDICE 2007, 31st workshop on Compound Semiconductor Devices and Integrated Circuits (2007)
[SIDCimport-298]
|
|
5.
| Science Article AlxGa1-xN focal plane arrays for imaging applications in the extreme ultraviolet (EUV) wavelength range
/ John, J ; Malinowski, P. ; Hellings, G. ; Lorenz, A. ; et al
published in Optical Sensing Technology and Applications. Proceedings of the SPIE, 6585, pp. 658505 (2007)
10.1117/12.723023
[SIDCimport-295]
|
guest ::
