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1.
Science Article
Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
/
Malinowski, P.
;
John, J
;
Barkusky, F
;
Duboz, J.-Y.
;
et al
published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009)
[SIDCimport-403]
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