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| Science Article Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
/ Malinowski, P. ; John, J ; Barkusky, F ; Duboz, J.-Y. ; et al
published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009)
[SIDCimport-403]
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| Science Article (Ref.) Backside-Illuminated GaN-on-Si Schottky Photodiodes for UV Radiation Detection
/ Malinowski, P. ; John, J ; Duboz, J.-Y. ; Hellings, G. ; et al
published in IEEE Electron Device Letters, 30, pp. 1308-1310 (2009)
[SIDCimport-401]
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| Science Article AlGaN photo-detectors for applications in the extreme ultraviolet (EUV) wavelength range
/ Malinowski, P. ; John, J ; Lorenz, A. ; Aparicio, P. ; et al
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[SIDCimport-338]
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