Ref: SIDCimport-184

In-flight characterization and compensation of the optical properties of the EIT instrument

Defise, J.-M. ; Clette, F. ; Auchere, F.

published in Proceedings of SPIE, 3765, pp. 341-350 (1999)

Note: EUV, X-Ray and Gamma-Ray Instrumentation for Astronomy, eds. O.H. Siegmund and K.A. Flanagan

The record appears in these collections:
Royal Observatory of Belgium > Solar Physics & Space Weather (SIDC)
Science Articles > Non-refereed Articles

 Record created 2016-02-22, last modified 2016-02-22