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| Home > Science Articles > Non-refereed Articles > In-flight characterization and compensation of the optical properties of the EIT instrument |
Defise, J.-M. ; Clette, F. ; Auchere, F.
published in Proceedings of SPIE, 3765, pp. 341-350 (1999)
Note: EUV, X-Ray and Gamma-Ray Instrumentation for Astronomy, eds. O.H. Siegmund and K.A. Flanagan
The record appears in these collections:
Royal Observatory of Belgium > Solar Physics & Space Weather (SIDC)
Science Articles > Non-refereed Articles