000000169 001__ 169
000000169 005__ 20160222141712.0
000000169 037__ $$aSIDCimport-184
000000169 100__ $$aDefise, J.-M.
000000169 245__ $$aIn-flight characterization and compensation of the optical properties of the EIT instrument
000000169 260__ $$c1999
000000169 500__ $$aEUV, X-Ray and Gamma-Ray Instrumentation for Astronomy, eds. O.H. Siegmund and K.A. Flanagan
000000169 700__ $$aClette, F.
000000169 700__ $$aAuchere, F.
000000169 773__ $$c341-350$$pProceedings of SPIE$$v3765$$y1999
000000169 905__ $$apublished in
000000169 980__ $$aNONREF