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Science Article 
Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam / Malinowski, P. ; John, J ; Barkusky, F ; Duboz, J.-Y. ; et al
published in Proceedings of SPIE, 7361, pp. 73610T-73610T-8 (2009) [SIDCimport-403]

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