Solid confirmation of the broad DIB around 864.8 nm using stacked Gaia-RVS spectra

Zhao, H.; Marchal, O.; Pailler, F.; Schultheis, M.; Creevey, O. L.; Recio-Blanco, A.; Benson, K.; Huckle, H. E.; de Laverny, P.; Palicio, P. A.; Baker, S.; Marshall, D. J.; Bailer-Jones, C. A. L.; Contursi, G.; Álvarez, M. A.; Drimmel, R.; Dolding, C.; Sartoretti, P.; Slezak, I.; Cropper, M.; Seabroke, G. M.; Frémat, Y.; Kordopatis, G.; Panuzzo, P.; Smith, M.; Dharmawardena, T. E.; Zwitter, T.; Ordenovic, C.; Sordo, R.

doi:10.1051/0004-6361/202244343

Solid confirmation of the broad DIB around 864.8 nm using stacked Gaia-RVS spectra - Zhao, H. et al - published in Astronomy & Astrophysics, 666, pp. L12 (7pp) (2022) - SCART-2023-0038

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