261 20160222141714.0 10.1063/1.2834701 DOI SIDCimport-294 BenMoussa, A. 2008 Characterization of AlN metal-semiconductor-metal diodes in the spectral range of 44-360nm: Photoemission assessments STCE Hochedez, J.-F. Dahal, R. Li, J. Jiang, H.X. Soltani, A. De Jaeger, J-C. Kroth, U. Richter, M. Applied Physics Letters 92 2 2008 022108 http://cdsads.u-strasbg.fr/abs/2008ApPhL..92b2108B published in REFERD