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1.
| Conf. Poster Image Patch Analysis of Sunspots and Active Regions
/ Moon, Kevin ; Delouille, Véronique ; et al
Poster presented at Fall Meeting, AGU, New Orleans, LA, US on 2017-12-12
[POSTER-2018-0007]
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2.
| Conf. Talk (Inv.) Supervised and non-supervised classification in solar physics using advanced techniques
/ Delouille, Véronique ; Moon, Kevin ; et al
Invited talk presented at Space Weather: a Multi-Disciplinary Approach, Lorentz Center workshop, Leiden, NL on 2017-09-26
[CTALK-2018-0009]
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3.
| Conf. Poster Image patch analysis and clustering of sunspots: a dimensionality reduction approach
/ Moon, K. ; Li, J. ; et al
Poster presented at IEEE International Conference on Image Processing, 2014, 28-30 October, Paris, France (poster) on 2014-10-xx
[SIDCimport-1461]
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4.
| Conf. Talk Image patch analysis and clustering of sunspots: a dimensionality reduction approach
/ Moon, K. ; Li, J. ; et al
Talk presented at 7th Solar Information Processing workshop, La-Roche-en-Ardenne, Belgium August 18 – 21 2014 (oral) on 2014-08-xx
[SIDCimport-1459]
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5.
| Science Article (Ref.) Meta learning of bounds on the Bayes classifier error
/ Moon, K. ; Delouille, V. ; Hero III, A.O.
published in Proceeding of IEEE Signal Processing and SP Education workshop (2015)
[SIDCimport-635]
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6.
| Science Article (Ref.) Image patch analysis of sunspots and active regions. II. Clustering via dictionary learning
/ Moon, K. ; Delouille, V. ; Li, J. ; De Visscher, R. ; et al
published in Journal of Space Weather and Space Climate, 6, pp. A3 (2016)
10.1051/swsc/2015043
[SIDCimport-634]
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7.
| Science Article (Ref.) Image patch analysis of sunspots and active regions. I. Intrinsic dimension and correlation analysis
/ Moon, K. ; Li, J. ; Delouille, V. ; De Visscher, R. ; et al
published in Journal of Space Weather and Space Climate, 6, pp. A2 (2016)
10.1051/swsc/2015044
[SIDCimport-632]
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8.
| Science Article (Ref.) Image patch analysis and clustering of sunspots: a dimensionality reduction approach
/ Moon, K. ; Li, J. ; Delouille, V. ; Watson, F. ; et al
published in IEEE International Conference on Image Processing (2014)
[SIDCimport-595]
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