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Irradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter
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Irradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter
-
BenMoussa, A.
et al
- published in IEEE Trans. on Nuclear Science, 60, pp. 3907-3914 (2013) - SIDCimport-575
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