000000501 001__ 501
000000501 005__ 20160606134127.0
000000501 037__ $$aSIDCimport-575
000000501 100__ $$aBenMoussa, A.
000000501 245__ $$aIrradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter
000000501 260__ $$c2013
000000501 594__ $$aSTCE
000000501 700__ $$aGissot, S.
000000501 700__ $$aGiordanengo, B.
000000501 700__ $$aMenants, Guy
000000501 700__ $$aWang, X
000000501 700__ $$aWolfs, B.
000000501 700__ $$aBogaerts, J.
000000501 700__ $$aSchühle, U.
000000501 700__ $$aBerger, G.
000000501 700__ $$aGottwald, A.
000000501 700__ $$aLaubis, C.
000000501 700__ $$aKroth, U.
000000501 700__ $$aScholze, F.
000000501 700__ $$aSoltani, A.
000000501 700__ $$aSaito, T.
000000501 773__ $$c3907-3914$$i5$$pIEEE Trans. on Nuclear Science$$v60$$y2013
000000501 85642 $$ahttp://ieeexplore.ieee.org/xpl/login.jsp?tp==6616665=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F23%2F6626362%2F06616665
000000501 85642 $$ahttp://www.researchgate.net/publication/258047546_Irradiation_Damage_Tests_on_Backside-Illuminated_CMOS_APS_Prototypes_for_the_Extreme_Ultraviolet_Imager_On-Board_Solar_Orbiter
000000501 905__ $$apublished in
000000501 980__ $$aREFERD