000000261 001__ 261
000000261 005__ 20160222141714.0
000000261 0247_ $$2DOI$$a10.1063/1.2834701
000000261 037__ $$aSIDCimport-294
000000261 100__ $$aBenMoussa, A.
000000261 245__ $$aCharacterization of AlN metal-semiconductor-metal diodes in the spectral range of 44-360nm: Photoemission assessments
000000261 260__ $$c2008
000000261 594__ $$aSTCE
000000261 700__ $$aHochedez, J.-F.
000000261 700__ $$aDahal, R.
000000261 700__ $$aLi, J.
000000261 700__ $$aJiang, H.X.
000000261 700__ $$aSoltani, A.
000000261 700__ $$aDe Jaeger, J-C.
000000261 700__ $$aKroth, U.
000000261 700__ $$aRichter, M.
000000261 773__ $$c022108$$i2$$pApplied Physics Letters$$v92$$y2008
000000261 85642 $$ahttp://cdsads.u-strasbg.fr/abs/2008ApPhL..92b2108B
000000261 905__ $$apublished in
000000261 980__ $$aREFERD