de Cuyper, J.-P. ; Hensberge, H.

published in Astronomical Data Analysis Software and Systems VII, 145, pp. 312 (1998)

Abstract: An analysis of series of flat-field exposures obtained in echelle mode adds support to the view that the performance of an instrument should be monitored closely and described {\em quantitatively}. This simplifies enormously the data reduction procedure and allows the user to interpret high-quality data correctly.

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